contact degradation meaning in Chinese
接触变质
Examples
- The analysis of i - v characteristic and microstructure shows that the failure of device results from the gate sinking and ohmic contact degradation
通过温度斜坡试验，对器件试验前后的i - v特性的对比分析和微结构的分析表明，欧姆接触退化和栅下沉共同导致了器件的失效。